Quantiam’s 34,000-ft2 R&D and trial manufacturing facility in Edmonton houses our extensive in-house materials characterization and development capabilities. Contact us today to find out how we can solve your materials and process-related pain points.
Extensive high temperature testing up to 1500°C under various atmospheres including:
Catalyst performance testing/screening:
Technique Characteristics |
JEOL JSM-7001F FE-SEM/EDS
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JEOL JSM-6010LV SEM/EDS
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Perkin Elmers PHI-5600 small spot XPS
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Perkin Elmers PHI-600 SAM/SIMS
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|
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Field Emission Scanning Electron Microscopy w/ Energy Dispersive Spectroscopy | Scanning Electron Microscopy w/ Energy Dispersive Spectroscopy | X-ray Photoelectron Spectroscopy (XPS) | Auger Electron Spectroscopy/Scanning Auger Multiprobe (AES-SAM) | Secondary Ion Mass Spectrometry (SIMS) | |
Probe | electrons | electrons | x-ray | electrons | ions |
Detected Particles | electrons and photons | electrons and photons | electrons | electrons | +ve or -ve ions |
Range | B and higher | B and higher | Li and higher | Li and higher | 1 - 511 amu |
Sampling Depth | 0.5 – 5 μm | 0.5 – 5 μm | 10 - 50 Å | 4 - 30 Å | 20 - 50 Å |
Detection Limit* | 0.5 to 2.0 at% | 0.5 to 2.0 at% | 0.1 to 1.0 at% | 0.1 to 1.0 at% | ppm to ppb |
Depth Profiling (Speed and Type) | N/A | N/A | fast, argon ions | fast, argon ions | fast, argon/oxygen |
Information | elemental | elemental | elemental, chemical | elemental, some chemical | elemental, some structural |
Quantitative | semi | semi | semi | semi | not usually |
Probe Spatial Resolution | 1.2 nm | 4.0 nm | 75 μm | ~35 nm | 200 μm to 1 mm |
Advantages |
excellent spatial resolution
elemental mapping
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excellent spatial resolution
elemental mapping
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few limitations on sample type
chemical state information
low damage to sample
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good spatial resolution
elemental mapping
analyzing conductors and semiconductors
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excellent sensitivity
isotope and hydrogen detection
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* Detection limit varies by element